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2MBI300U4H-120 Datasheet(PDF) 8 Page - Fuji Electric |
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2MBI300U4H-120 Datasheet(HTML) 8 Page - Fuji Electric |
8 / 13 page H04-004-03a MS5F6037 13 8 Reliability Test Results Test cate- gorie s Test items Reference norms EIAJ ED-4701 (Aug.-2001 edition) Number of test sample Number of failure sample 1 Terminal Strength Test Method 401 5 0 (Pull test) MethodⅠ 2 Mounting Strength Test Method 402 5 0 methodⅡ 3 Vibration Test Method 403 5 0 Condition code B 4 Shock Test Method 404 5 0 Condition code B 1 High Temperature Storage Test Method 201 5 0 2 Low Temperature Storage Test Method 202 5 0 3 Temperature Humidity Test Method 103 5 * Storage Test code C 4 Unsaturated Test Method 103 5 0 Pressurized Vapor Test code E 5 Temperature Cycle Test Method 105 5 0 6 Thermal Shock Test Method 307 5 0 method Ⅰ Condition code A 1 High temperature Reverse Bias Test Method 101 5 * 2 High temperature Bias Test Method 101 5 0 ( for gate ) 3 Temperature Humidity Bias Test Method 102 5 * Condition code C 4 Intermitted Operating Life Test Method 106 5 0 (Power cycling) ( for IGBT ) * under confirmation |
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