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ISO7240CFDW Datasheet(PDF) 6 Page - Texas Instruments |
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ISO7240CFDW Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 16 page  ELECTRICAL CHARACTERISTICS SWITCHING CHARACTERISTICS ISO7240CF SLLS869B – SEPTEMBER 2007 – REVISED APRIL 2008 ................................................................................................................................................ www.ti.com VCC1 and VCC2 at 3.3-V operation, over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Quiescent 0.5 1 ICC1 Supply current VI = VCC or 0 V, all channels, no load mA 25 Mbps 3 5 Quiescent 9.5 15 ICC2 Supply current VI = VCC or 0 V, all channels, no load mA 25 Mbps 10.5 17 IOFF Sleep mode output current DISABLE at VCC, single channel 0 µA IOH = –4 mA, See Figure 1 VCC – 0.4 VOH High-level output voltage V IOH = –20 µA, See Figure 1 VCC – 0.1 IOL = 4 mA, See Figure 1 0.4 VOL Low-level output voltage V IOL = 20 µA, See Figure 1 0.1 VI(HYS) Input voltage hysteresis 200 mV IIH High-level input current 10 IN, DISABLE, CTRL from 0 V to VCC µA IIL Low-level input current –10 CI Input capacitance to ground IN at VCC, VI = 0.4 sin (4E6πt) 1 pF CMTI Common-mode transient immunity VI = VCC or 0 V, See Figure 4 25 50 kV/ µs VCC1 and VCC2 at 3.3-V operation, over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tPLH, tPHL Propagation delay, low-to-high-level output 25 56 See Figure 1 ns PWD Pulse-width distortion |tPHL – tPLH| (1) 4 tsk(pp) Part-to-part skew (2) 10 ns tsk(o) Channel-to-channel output skew (3) 0 3 ns tr Output signal rise time 2 See Figure 1 ns tf Output signal fall time 2 twake Wake time from input disable See Figure 2 15 µs tfs Failsafe output delay time from input power loss See Figure 3 18 µs (1) Also referred to as pulse skew. (2) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. (3) tsk(o) is the skew between specified outputs of a single device with all driving inputs connected together and the outputs switching in the same direction while driving identical specified loads. 6 Submit Documentation Feedback Copyright © 2007–2008, Texas Instruments Incorporated Product Folder Link(s) :ISO7240CF |
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