Symbol

Parameter

Test Condition

Min

Max

Unit

Input Capacitance

6

pF

Output Capacitance

12

pF

Note: 1. Sampled only, not 100% tested.

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

Input Leakage Current

0V

10

µA

Output Leakage Current

0V

10

µA

(1)

Supply Current (TTL and CMOS inputs)

25

mA

(1)

Supply Current (Standby) TTL

1mA

(1)

Supply Current (Standby) CMOS

50

µA

Input Low Voltage

–0.3

0.8

V

Input High Voltage

2

V

Output Low Voltage

0.4

V

Output High Voltage

µA

2.4

V

Note: 1. All I/O’s open circuit.

Table 6. Read Mode DC Characteristics for M28C16A and M28C17A

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

0.4V to 2.4V

Input and Output Timing Ref. Voltages

0.8V to 2.0V

Note that Output Hi-Z is defined as the point where data is no longer driven.

Table 4. AC Measurement Conditions

AI02101B

4.5V to 5.5V Operating Voltage

2.7V to 3.6V Operating Voltage

VCC – 0.3V

0V

0.5 VCC

2.4V

0.4V

2.0V

0.8V

Figure 5. AC Testing Input Output Waveforms

AI02114

OUT

CL = 30pF

CL includes JIG capacitance

IOL

DEVICE

UNDER

TEST

IOH

VCC

Figure 6. AC Testing Equivalent Load Circuit

5/19

M28C16A, M28C17A