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M27C801-80K6TR Datasheet(PDF) 4 Page - STMicroelectronics |
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M27C801-80K6TR Datasheet(HTML) 4 Page - STMicroelectronics |
4 / 16 page M27C801 4/16 DEVICE OPERATION The operating modes of the M27C801 are listed in the Operating Modes table. A single power supply is required in the read mode. All inputs are TTL levels except for GVPP and 12V on A9 for Elec- tronic Signature and Margin Mode Set or Reset. Read Mode The M27C801 has two control functions, both of which must be logically active in order to obtain data at the outputs. Chip Enable (E) is the power control and should be used for device selection. Output Enable (G) is the output control and should be used to gate data to the output pins, indepen- dent of device selection. Assuming that the ad- dresses are stable, the address access time (tAVQV) is equal to the delay from E to output (tELQV). Data is available at the output after a delay of tGLQV from the falling edge of G, assuming that E has been low and the addresses have been sta- ble for at least tAVQV-tGLQV. Standby Mode The M27C801 has a standby mode which reduces the supply current from 35mA to 100µA. The M27C801 is placed in the standby mode by applying a CMOS high signal to the E input. When in the standby mode, the outputs are in a high im- pedance state, independent of the GVPP input. Table 5. AC Measurement Conditions High Speed Standard Input Rise and Fall Times ≤ 10ns ≤ 20ns (10% to 90%) Input Pulse Voltages 0 to 3V 0.4 to 2.4V Input and Output Timing Ref. Voltages 1.5V 0.8 and 2V Figure 3. AC Testing Input Output Waveform AI01822 3V High Speed 0V 1.5V 2.4V Standard 0.4V 2.0V 0.8V Figure 4. AC Testing Load Circuit AI01823B 1.3V OUT CL CL = 30pF for High Speed CL = 100pF for Standard CL includes JIG capacitance 3.3k Ω 1N914 DEVICE UNDER TEST Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz) Note: 1. Sampled only, not 100% tested. Symbol Parameter Test Condition Min Max Unit CIN Input Capacitance VIN = 0V 6pF COUT Output Capacitance VOUT = 0V 12 pF |
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