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M28LV64-200XMS1 Datasheet(PDF) 8 Page - STMicroelectronics |
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M28LV64-200XMS1 Datasheet(HTML) 8 Page - STMicroelectronics |
8 / 18 page Symbol Alt Parameter Test Condition M28LV64 Unit -200 -250 -300 min max min max min max tAVQV tACC Address Valid to Output Valid E= VIL,G = VIL 200 250 300 ns tELQV tCE Chip Enable Low to Output Valid G= VIL 200 250 300 ns tGLQV tOE Output Enable Low to Output Valid E= VIL 100 150 150 ns tEHQZ (1,2 ) tDF Chip Enable High to Output Hi-Z G= VIL 055 0 60 060 ns tGHQZ (1,2) tDF Output Enable High to Output Hi-Z E=VIL 055 0 60 060 ns tAXQX (2) tOH Address Transition to Output Transition E= VIL,G = VIL 000 ns Notes: 1. Output Hi-Z is defined as the point at which data is no longer driven. 2. Guaranted, not 100% sampled. Table 7. Read Mode AC Characteristics (TA =0 to 70 °C or –40 to 85°C; VCC = 2.7V to 3.6V) AI00749B VALID tAVQV tAXQX tGLQV tEHQZ tGHQZ DATA OUT A0-A12 E G DQ0-DQ7 tELQV Hi-Z Figure 9. Read Mode AC Waveforms Note: Wri te Enable (W) = High 8/18 M28LV64 |
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