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M58MR032CZC Datasheet(PDF) 3 Page - STMicroelectronics |
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M58MR032CZC Datasheet(HTML) 3 Page - STMicroelectronics |
3 / 52 page 3/52 M58MR032C, M58MR032D Table 1. Signal Names A16-A20 Address Inputs ADQ0-ADQ15 Data Input/Outputs or Address Inputs, Command Inputs E Chip Enable G Output Enable W Write Enable RP Reset/Power-down WP Write Protect K Burst Clock L Latch Enable WAIT Wait Data in Burst Mode BINV Bus Invert VDD Supply Voltage VDDQ Supply Voltage for Input/Output Buffers VPP Optional Supply Voltage for Fast Program & Erase VSS Ground DU Don’t Use as Internally Connected NC Not Connected Internally Organization The M58MR032 is organized as 2Mb by 16 bits. The first sixteen address lines are multiplexed with the Data Input/Output signals on the multiplexed address/data bus ADQ0-ADQ15. The remaining address lines A16-A20 are the MSB addresses. Chip Enable E, Output Enable G and Write Enable W inputs provide memory control. The clock K input synchronizes the memory to the microprocessor during burst read. Reset RP is used to reset all the memory circuitry and to set the chip in power-down mode if a proper setting of the Read Configuration Register en- ables this function. WAIT output indicates to the microprocessor the status of the memory during the burst mode oper- ations. Memory Blocks The device features asymmetrically blocked archi- tecture. M58MR032 has an array of 71 blocks and is divided into two banks A and B, providing Dual Bank operations. While programming or erasing in Bank A, read operations are possible into Bank B or vice versa. Only one bank at the time is allowed to be in program or erase mode. It is possible to perform burst reads that cross bank boundaries. The memory features an erase suspend allowing reading or programming in another block. Once suspended the erase can be resumed. Program can be suspended to read data in another block and then resumed. The Bank Size and sectoriza- tion are summarized in Table 3. Parameter Blocks are located at the top of the memory address space for the M58MR032C, and at the bottom for the M58MR032D. The memory maps are shown in Figure 3. Table 2. Absolute Maximum Ratings (1) Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi- tions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant qual- ity documents. 2. Depends on range. 3. Minimum Voltage may undershoot to –2V during transition and for less than 20ns. Symbol Parameter Value Unit TA Ambient Operating Temperature (2) –40 to 85 °C TBIAS Temperature Under Bias –40 to 125 °C TSTG Storage Temperature –55 to 155 °C VIO (3) Input or Output Voltage –0.5 to VDDQ+0.5 V VDD, VDDQ Supply Voltage –0.5 to 2.7 V VPP Program Voltage –0.5 to 13 V |
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