CAT5111

© Catalyst Semiconductor, Inc.

3

Doc. No. MD-2008 Rev. Q

Characteristics subject to change without notice

OPERATION MODES

INC

¯¯¯

CS

¯¯

U/D

¯

Operation

High to Low

Low

High

High to Low

Low

Low

High

Low to High

X

Store Wiper Position

Low

Low to High

X

No Store, Return to Standby

X

High

X

Standby

ABSOLUTE MAXIMUM RATINGS

(1)

Parameters

Ratings

Units

Supply Voltage

-0.5 to +7V

V

Inputs

CS

¯¯ to GND

V

INC

¯¯¯ to GND

V

U/D

¯ to GND

V

V

V

V

Parameters

Ratings

Units

Operating Ambient Temperature

Commercial (‘C’ or Blank suffix)

0 to 70

ºC

Industrial (‘I’ suffix)

-40 to +85

ºC

Junction Temperature

+150

ºC

Storage Temperature

-65 to 150

ºC

Lead Soldering (10s max)

+300

ºC

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Test Method

Min

Typ

Max

Units

(2)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(2) (3)

Latch-Up

JEDEC Standard 17

100

mA

Data Retention

MIL-STD-883, Test Method 1008

100

Years

Endurance

MIL-STD-883, Test Method 1003

1,000,000

Stores

DC ELECTRICAL CHARACTERISTICS

Power Supply

Symbol

Parameter

Conditions

Min

Typ

Max

Units

Operating Voltage Range

2.5

–

6

V

–

–

200

µA

Supply Current (Increment)

–

–

100

µA

–

–

1000

µA

Supply Current (Write)

–

–

500

µA

(3)

Supply Current (Standby)

CS

U/D

¯, INC

–

75

150

µA

Notes:

(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this

specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.

(2) This parameter is tested initially and after a design or process change that affects the parameter.

(5) These parameters are periodically sampled and are not 100% tested.

Potentiometer

Equivalent Circuit