4

Specifications ispLSI 1032E

Output Load Conditions (see Figure 2)

Switching Test Conditions

TEST CONDITION

R1

R2

CL

A

470Ω

390Ω

35pF

B

∞

390Ω

35pF

470Ω

390Ω

35pF

Active High

Active Low

C

470Ω

390Ω

5pF

∞

390Ω

5pF

Active Low to Z

at V +0.5V

OL

Active High to Z

at V

-0.5V

OH

Table 2-0004/1032E

Figure 2. Test Load

+ 5V

R1

R2

Device

Output

Test

Point

0213a

DC Electrical Characteristics

Over Recommended Operating Conditions

SYMBOL

1. One output at a time for a maximum duration of one second. V

= 0.5V was selected to avoid test problems

by tester ground degradation. Characterized but not 100% tested.

2. Measured using eight 16-bit counters.

3. Typical values are at V = 5V and T = 25°C.

4. Maximum I

varies widely with specific device configuration and operating frequency. Refer to the Power Consumption

section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to

estimate maximum I

.

Table 2-0007/1032E

1

PARAMETER

2, 4

Output Low Voltage

Output High Voltage

Input or I/O High Leakage Current

Input or I/O Low Leakage Current

ispEN Input Low Leakage Current

I/O Active Pull-Up Current

Output Short Circuit Current

Operating Power Supply Current

I = 8 mA

I

= -4 mA

3.5V ≤ V ≤ V

0V ≤ V ≤ V (Max.)

0V ≤ V ≤ V

0V ≤ V ≤ V

V = 5V, V

= 0.5V

V = 0.5V, V = 3.0V

f

= 1 MHz

OL

OH

IN

IL

IN

CC

IN

IL

IN

IL

CC

OUT

CLOCK

IL

IH

CONDITION

MIN.

TYP.

MAX.

UNITS

3

–

2.4

–

–

–

–

–

–

–

–

–

–

–

–

–

–

190

190

0.4

–

10

-10

-150

-150

-200

–

–

V

V

μA

μA

μA

μA

mA

mA

mA

CC

A

OUT

CC

CC

Commercial

Industrial

Input Pulse Levels

Table 2-0003/1032E

Input Rise and Fall Time

10% to 90%

Input Timing Reference Levels

Output Timing Reference Levels

Output Load

GND to 3.0V

1.5V

1.5V

See Figure 2

3-state levels are measured 0.5V from

steady-state active level.

-125

Others

≤ 2 ns

≤ 3 ns