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LC5512MC-52FN208I Datasheet(PDF) 22 Page - Lattice Semiconductor |
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LC5512MC-52FN208I Datasheet(HTML) 22 Page - Lattice Semiconductor |
22 / 92 page Lattice Semiconductor ispXPLD 5000MX Family Data Sheet 22 Absolute Maximum Ratings 1, 2, 3 ispXPLD 5000MC ispXPLD 5000MB/V 1.8V 2.5V/3.3V Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . -0.5 to 2.5V . . . . . . . . . . . . . . . . -0.5 to 5.5V PLL Supply Voltage (VCCP) . . . . . . . . . . . . . . . . . . -0.5 to 2.5V . . . . . . . . . . . . . . . . -0.5 to 5.5V Output Supply Voltage (VCCO) . . . . . . . . . . . . . . . . -0.5 to 4.5V . . . . . . . . . . . . . . . . -0.5 to 4.5V IEEE 1149.1 TAP Supply Voltage (VCCJ) . . . . . . . . -0.5 to 4.5V . . . . . . . . . . . . . . . . -0.5 to 4.5V Input Voltage Applied 4, 5 . . . . . . . . . . . . . . . . . . . . . -0.5 to 5.5V . . . . . . . . . . . . . . . . -0.5 to 5.5V Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . -65 to 150°C . . . . . . . . . . . . . . . -65 to 150°C Junction Temperature (TJ) with Power Applied . . . -55 to 150°C . . . . . . . . . . . . . . . -55 to 150°C 1. Stress above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied (while programming, following the programming specifications). 2. Compliance with the Lattice Thermal Management document is required. 3. All voltages referenced to GND. 4. Overshoot and Undershoot of -2V to (VIHMAX +2) volts not to exceed 6V is permitted for a duration of <20ns. 5. A maximum of 64 I/Os per device with VIN > 3.6V is allowed. Recommended Operating Conditions E 2CMOS Erase Reprogram Specifications Hot Socketing Characteristics 1, 2, 3, 4 Symbol Parameter Min. Max. Units VCC Supply Voltage for 1.8V Devices (ispXPLD 5000MC) 1.65 1.95 V Supply Voltage for 2.5V Devices (ispXPLD 5000MB) 2.3 2.7 V Supply Voltage for 3.3V Devices (ispXPLD 5000MV) 3 3.6 V VCCP PLL Block Supply Voltage for PLL 1.8V Devices 1.65 1.95 V PLL Block Supply Voltage for PLL 2.5V Devices 2.3 2.7 V PLL Block Supply Voltage for PLL 3.3V Devices 3 3.6 V TJ Junction Temperature (Commercial Operation) 0 90 C Junction Temperature (Industrial Operation) -40 105 C Parameter Min. Max. Units Erase/Reprogram Cycle 1 1,000 — Cycles 1. Valid over commercial temperature range. Symbol Parameter Condition Min. Typ. Max. Units IDK Input or I/O Leakage Current 0 ≤ VIN ≤ 3.0V — +/-50 +/-800 μA 1. Insensitive to sequence of VCC and VCCO when VCCO ≤ 1.0V. For VCCO > 1.0V, VCC min must be present. However, assumes monotonic rise/fall rates for VCC and VCCO, provided (VIN - VCCO) ≤ 3.6V. 2. 0 ≤ VCC ≤ VCC (MAX), 0 ≤ VCCO ≤ VCCO (MAX) 3. IDK is additive to IPU, IPD or IBH. Device defaults to pull-up until non-volatile cells are active. 4. LVTTL, LVCMOS only. |
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