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LC5512MC-5Q208C Datasheet(PDF) 45 Page - Lattice Semiconductor |
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LC5512MC-5Q208C Datasheet(HTML) 45 Page - Lattice Semiconductor |
45 / 92 page Lattice Semiconductor ispXPLD 5000MX Family Data Sheet 45 Boundary Scan Timing Specifications Over Recommended Operating Conditions Parameter Description Min Max Units tBTCP TCK [BSCAN] clock pulse width 40 — ns tBTCPH TCK [BSCAN] clock pulse width high 20 — ns tBTCPL TCK [BSCAN] clock pulse width low 20 — ns tBTS TCK [BSCAN] setup time 8 — ns tBTH TCK [BSCAN] hold time 10 — ns tBTRF TCK [BSCAN] rise/fall time 50 — mV/ns tBTCO TAP controller falling edge of clock to valid output — 10 ns tBTCODIS TAP controller falling edge of clock to valid disable — 10 ns tBTCOEN TAP controller falling edge of clock to valid enable — 10 ns tBTCRS BSCAN test capture register setup time 8 — ns tBTCRH BSCAN test capture register hold time 10 — ns tBUTCO BSCAN test update register, falling edge of clock to valid output — 25 ns tBTUODIS BSCAN test update register, falling edge of clock to valid disable — 25 ns tBTUPOEN BSCAN test update register, falling edge of clock to valid enable — 25 ns |
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