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LC5512MC-52Q256C Datasheet(PDF) 48 Page - Lattice Semiconductor

Part # LC5512MC-52Q256C
Description  3.3V, 2.5V and 1.8V In-System Programmable eXpanded Programmable Logic Device XPLD??Family
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Manufacturer  LATTICE [Lattice Semiconductor]
Direct Link  http://www.latticesemi.com
Logo LATTICE - Lattice Semiconductor

LC5512MC-52Q256C Datasheet(HTML) 48 Page - Lattice Semiconductor

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Lattice Semiconductor
ispXPLD 5000MX Family Data Sheet
48
Switching Test Conditions
Figure 21 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 14.
Figure 21. Output Test Load, LVTTL and LVCMOS Standards
Table 14. Test Fixture Required Components
Test Condition
R1
R2
CL
Timing Ref.
VCCO
Default LVCMOS 1.8 I/O (L -> H, H -> L)
106
106
35pF
VCCO/2
1.8V
LVCMOS I/O (L -> H, H -> L)
35pF
LVCMOS3.3 = 1.5V
LVCMOS3.3 = 3.0V
LVCMOS2.5 = VCCO/2
LVCMOS2.5 = 2.3V
LVCMOS1.8 = VCCO/2
LVCMOS1.8 = 1.65V
Default LVCMOS 1.8 I/O (Z -> H)
106
35pF
VCCO/2
1.65V
Default LVCMOS 1.8 I/O (Z -> L)
106
35pF
VCCO/2
1.65V
Default LVCMOS 1.8 I/O (H -> Z)
106
5pF
VOH - 0.15
1.65V
Default LVCMOS 1.8 I/O (L -> Z)
106
5pF
VOL + 0.15
1.65V
Note: Output test conditions for all other interfaces are determined by the respective standards.
VCCO
R1
R2
CL*
Device
Output
*CL includes test fixture and probe capacitance.
Test
Point


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