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FOD050L Datasheet(PDF) 7 Page - Fairchild Semiconductor |
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FOD050L Datasheet(HTML) 7 Page - Fairchild Semiconductor |
7 / 13 page ©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com FOD050L, FOD250L, FOD053L Rev. 1.0.2 7 Test Circuits Pulse Gen CM V V FF B A +- +3.3 V O V - I F 3 4 + F V - 2 1 Shield Noise 6 O 5 GND 7 8 V B V CC V L R PLH OL V VO 0 3.3 V 50% 50% F I T PHL T Switch at A : I = 0 mA F Switch at A : I = 16 mA F tr VO O V OL V 3.3 V 0 V 10% 10% 90% CM V 1000 V 4 5 Noise 1 2 3 Shield 8 7 6 +3.3 V O V VCC V01 V02 GND VF1 - + F2 V - F I + 10% DUTY CYCLE I/f < 100 µS F I MONITOR L R C = 1.5 pF L Pulse Generator tr = 5ns Z = 50 O Ω GND + 4 5 1 3 2 - F2 V VF1 - Shield Noise +3.3 V CC 8 V L V 6 02 V 7 R 01 VO V CM A B Pulse Gen F I +- + 3 I Monitor F 4 I/f < 100 µs 10% D.C. tr = 5ns Generator Pulse Z = 50 O + V F I Ω F - 2 1 Shield Noise V O O 6 5 GND 7 8 V B V L R CC V +3.3 V 0.1 µF L C = 1.5 pF 0.1 µF Test Circuit for FOD050L and FOD250L Test Circuit for FOD053L Test Circuit for FOD050L and FOD250L Test Circuit for FOD053L f t 0.1 µF 0.1 µF FF V m R m R 90% Fig. 11 Common Mode Immunity Test Circuit Fig. 10 Switching Time Test Circuit |
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Similar Description - FOD050L |
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