©2004 Fairchild Semiconductor Corporation

www.fairchildsemi.com

FOD410, FOD4108, FOD4116, FOD4118 Rev. 1.1.4

2

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Note:

and Pins 4, 5 and 6 are common.

Symbol

Parameters

Device

Value

Units

TOTAL DEVICE

Storage Temperature

All

-55 to +150

°C

Operating Temperature

All

-55 to +100

°C

Lead Solder Temperature (Wave)

All

260 for 10 sec

°C

Junction Temperature Range

All

125

°C

(rms AC voltage, 60Hz, 1 min. duration)

All

5000

Vac(rms)

Total Device Power Dissipation @ 25°C

Derate above 25°C

All

500

mW

8.3

mW/°C

EMITTER

Continuous Forward Current

All

30

mA

Reverse Voltage

All

6

V

Total Power Dissipation 25°C Ambient

Derate above 25°C

All

50

mW

5.4

mW/°C

DETECTOR

Off-State Output Terminal Voltage

FOD410, FOD4116

600

V

FOD4108, FOD4118

800

Peak Non-Repetitive Surge Current

(single cycle 60Hz sine wave)

All

3

A

Peak On-State Current

All

300

mA

Total Power Dissipation @ 25°C Ambient

Derate above 25°C

All

450

mW

6.25

mW/°C