HD74LS75

Rev.3.00, May 10, 2006, page 4 of 5

Testing Method

Test Circuit

D

Q

Q

Q

Q

D

P.G.

Ω

G

G

P.G.

Ω

Notes:

1.

Test is put into the each flip-flop.

2.

3.

All diodes are 1S2074(H).

Waveform

0V

3V

0V

3V

D

G

Q

Q

10%

90%

1.3 V

1.3 V

1.3 V

1.3 V

1.3 V

10%

90%

1.3 V

10%

90%

1

µs

1

µs

10%

500ns

500ns

90%

1.3 V

1.3 V

1.3 V

1.3 V

1.3 V

Notes:

1.

≤ 10 ns,t

TLH

≤ 10 ns.

2.

When measuring propugation delay times from the D input, the corresponding G input must be

held high.