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| HAF1001 |
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RENESAS |
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6 page
HAF1001 Rev.4.00 Apr 27, 2006 page 6 of 7 –12 –10 –8 –4 –6 –2 0 0.0001 1 200 180 160 140 120 0 100 –2 –4 –6 –8 –10 ID = –5 A 0.001 0.01 0.1 –9 V VDD = –36 V –24 V –12 V Gate to Source Voltage vs. Shutdown Time of Load-Short Test Shutdown Time of Load-Short Test PW (S) Shutdown Case Temperature vs. Gate to Source Voltage Gate to Source Voltage VGS (V) tr td(on) Vin 90% 90% 10% 10% Vout td(off) 90% 10% tf Switching Time Test Circuit Waveform Pulse Width PW (S) Normalized Transient Thermal Impedance vs. Pulse Width 3 1 0.3 0.1 0.03 0.01 10 µ 100 µ 1 m 10 m 100 m 1 10 Tc = 25°C D = 1 0.5 0.2 0.1 0.05 0.02 0.01 1shot pulse PDM PW T D = PW T θch – c (t) = γ s (t) • θch – c θch – c = 2.50°C/W, Tc = 25°C Vin Monitor D.U.T. Vin –5 V RL Vout Monitor 50 Ω VDD = –30 V |
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