www.vishay.com

8

Document Number: 72053

S-71155-Rev. B, 11-Jun-07

Vishay Siliconix

DG411HS/412HS/413HS

TEST CIRCUITS

Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Tech-

nology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability

Figure 4. Charge Injection

1 nF

D

V+

S

V-

3 V

IN

-15 V

GND

+ 15 V

+ 5 V

OFF

ON

OFF

OFF

ON

OFF

Q =

Figure 5. Crosstalk

0 V, 2.4 V

C = RF bypass

0 V, 2.4 V

50

Ω

V+

- 15 V

GND

V -

NC

C

+ 15 V

C

+ 5 V

C

Figure 6. Off-Isolation

50

Ω

D

0 V, 2.4 V

V+

- 15 V

GND

V-

C

Off Isolation = 20 log

IN

+ 5 V

C

+ 15 V

S

C

C = RF Bypass

Figure 7. Source/Drain Capacitances

D

IN

S

V+

- 15 V

GND

V -

C

0 V, 2.4 V

Meter

HP4192A

Impedance

Analyzer

or Equivalent

+ 5 V

C

+ 15 V

C