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MAL215097601E3 Datasheet(PDF) 8 Page - Vishay Siliconix |
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MAL215097601E3 Datasheet(HTML) 8 Page - Vishay Siliconix |
8 / 9 page Document Number: 28395 For technical questions, contact: aluminumcaps1@vishay.com www.vishay.com Revision: 30-Oct-08 65 150 CRZ Aluminum Capacitors SMD (Chip), Very Low Z Vishay BCcomponents Table 6 Table 7 MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY FREQUENCY (Hz) IR MULTIPLIER UR =6.3 to 25 V UR =35V UR =50to 63V 100 0.70 0.65 0.60 300 0.80 0.80 0.75 1000 0.85 0.85 0.85 3000 0.93 0.93 0.93 10 000 0.95 0.95 0.95 30 000 0.97 0.97 0.97 100 000 1.00 1.00 1.00 TEST PROCEDURES AND REQUIREMENTS TEST PROCEDURE (quick reference) REQUIREMENTS NAME OF TEST REFERENCE Mounting IEC 60384-18, subclause 4.3 shall be performed prior to tests mentioned below; reflow soldering; for maximum temperature load refer to chapter “Mounting” ΔC/C: ± 5 % tan δ≤ spec. limit IL2 ≤ spec. limit Endurance IEC 60384-18/ CECC32300, subclause 4.15 Tamb =105 °C; UR applied; case size ≤ 10 x 10 x 14: 2000 hours case size ≥ 12.5 x 12.5 x 13: 3000 hours UR =6.3 V; ΔC/C: ± 25 % UR ≥ 10 V; ΔC/C: ± 20 % tan δ≤ 2 x spec. limit IL2 ≤ spec. limit Useful life CECC 30301, subclause 1.8.1 Tamb =105 °C; UR and IR applied; case size ≤ 10 x 10 x 10: 2500 hours case size = 10 x 10 x 14: 3000 hours case size ≥ 12.5 x 12.5 x 13: 5000 hours ΔC/C: ± 30 % tan δ≤ 3 x spec. limit IL2 ≤ spec. limit no short or open circuit total failure percentage: ≤ 1 % Shelf life (storage at high temperature) IEC 60384-18/ CECC32300, subclause 4.17 Tamb =105 °C; no voltage applied; 1000 hours after test: UR to be applied for 30 minutes, 24 to 48 hours before measurement for requirements see ‘Endurance test’ above |
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