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HEF4027BT Datasheet(PDF) 11 Page - NXP Semiconductors |
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HEF4027BT Datasheet(HTML) 11 Page - NXP Semiconductors |
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11 / 13 page  HEF4027B_5 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 05 — 10 November 2008 11 of 13 NXP Semiconductors HEF4027B Dual JK flip-flop 14. Abbreviations 15. Revision history Table 11. Abbreviations Acronym Description DUT Device Under Test ESD ElectroStatic Discharge HBM Human Body Model MM Machine Model Table 12. Revision history Document ID Release date Data sheet status Change notice Supersedes HEF4027B_5 20081110 Product data sheet - HEF4027B_4 Modifications: • Maximum Tamb changed to 85 °C and Tamb = 125 °C parameter data removed throughout. • Section 1 “General description” temperature range statement modified. • Section 10 “Static characteristics” IDD, IOL, IOH and II values revised. HEF4027B_4 20080703 Product specification - HEF4027B_CNV_3 HEF4027B_CNV_3 19950101 Product specification - HEF4027B_CNV_2 HEF4027B_CNV_2 19950101 Product specification - - |
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