NX3L1T5157GM datasheet(7/19 Pages) NXP

Part #	NX3L1T5157GM

Description	Low-ohmic single-pole double-throw switch

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Manufacturer	NXP [NXP Semiconductors]

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NX3L1T5157_1

Product data sheet

Rev. 01 — 16 September 2008

7 of 19

NXP Semiconductors

NX3L1T5157

Low-ohmic single-pole double-throw switch

[1]

Typical values are measured at Tamb =25 °C.

[2]

Measured at identical VCC, temperature and input voltage.

[3]

Flatness is deﬁned as the difference between the maximum and minimum value of ON resistance measured at identical VCC and

temperature.

11.3 ON resistance test circuit and graphs

RON(ﬂat)

ON resistance

(ﬂatness)

VI = GND to VCC;

ISW = 100 mA

[3]

VCC = 1.4 V

-

1.0

3.3

-

3.6

Ω

VCC = 1.65 V

-

0.5

1.2

-

1.3

Ω

VCC = 2.3 V

-

0.15

0.3

-

0.35

Ω

VCC = 2.7 V

-

0.13

0.3

-

0.35

Ω

Table 8.

ON resistance …continued

At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for graphs see Figure 7 to Figure 12.

Symbol

Parameter

Conditions

Tamb = −40 °C to +85 °C Tamb = −40 °C to +125 °C Unit

Min

Typ[1]

Max

Min

Max

RON =VSW / ISW.

(1) VCC = 1.5 V.

(2) VCC = 1.8 V.

(3) VCC = 2.5 V.

(4) VCC = 2.7 V.

(5) VCC = 3.3 V.

Measured at Tamb =25 °C.

Fig 6.

Test circuit for measuring ON resistance

Fig 7.

Typical ON resistance as a function of

input voltage

V

001aag563

VI

ISW

switch

S

1VIL

2VIH

switch

VSW

GND

VCC

VIL or VIH

Y0

Y1

S

Z

1

2

VI (V)

04

3

12

001aag564

0.8

0.4

1.2

1.6

RON

(

Ω)

0

(1)

(2)

(5)

(4)

(3)

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