6

4597G–AUTO–10/06

T2526

6.1

ESD

All pins

⇒2000V HBM; 200V MM, MIL-STD-883C, Method 3015.7

6.2

Reliability

Electrical qualification (1000h) in molded plastic package

7

Input

7.1

Input DC current

See Figure 7-10 on page 10

5I

IN_DCMAX

–400

µA

C

7.2

Input DC-current

See Figure 7-4 on page

8

T

5I

IN_DCMAX

–700

µA

B

7.3

Min. detection

threshold current

See Figure 7-2 on page

7

Test signal:

See Figure 7-9 on page 10

V

I

square pp

burst N = 16

f = f

Figure 7-8 on page 9

–850

pA

B

7.4

Min. detection

threshold current with

AC current disturbance

IIN_AC100 = 3 µA at

100 Hz

3

–2000

pA

C

7.5

Max. detection

threshold current with

V

Test signal:

See Figure 7-9 on page 10

V

1µA

square pp

burst N = 16

Figure 7-8 on page 9

3

I

Eemax

–500

µA

D

8

Controlled Amplifier and Filter

8.1

Maximum value of

variable gain (CGA)

G

VARMAX

51

dB

D

8.2

Minimum value of

variable gain (CGA)

–5

dB

D

8.3

Total internal

71

dB

D

8.4

Resulting center

frequency fusing

accuracy

f

f

03V-FUSE

+ 0.5

%A

6.

Electrical Characteristics, 5-V Operation (Continued)

No.

Parameters

Test Conditions

Pin

Symbol

Min.

Typ.

Max.

Unit

Type*

*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter

Notes:

1. Depending on version, see “Ordering Information”

2. BER = bit error rate; e.g., BER = 5% means that with P = 20 at the input pin 19...21 pulses can appear at the pin OUT

3. After transformation of input current into voltage