4

5297A–SEEPR–1/08

AT24C512B

2.

Memory Organization

AT24C512B, 512K SERIAL EEPROM: The 512K is internally organized as 512 pages of 128-bytes each. Random word

addressing requires a 16-bit data word address.

Note:

1. This parameter is characterized and is not 100% tested.

Note:

Table 2-1.

Pin Capacitance(1)

Applicable over recommended operating range from: T

Symbol

Test Condition

Max

Units

Conditions

Input/Output Capacitance (SDA)

8

pF

6

pF

Table 2-2.

DC Characteristics

Applicable over recommended operating range from: T

Symbol

Parameter

Test Condition

Min

Typ

Max

Units

Supply Voltage

1.8

3.6

V

Supply Voltage

2.5

5.5

V

I

CC

Supply Current

V

READ at 400 kHz

2.0

mA

Supply Current

WRITE at 400 kHz

3.0

mA

Standby Current

1.0

µA

V

3.0

µA

I

SB2

Standby Current

V

2.0

µA

V

6.0

µA

I

LI

Input Leakage Current

V

0.10

3.0

µA

I

LO

Output Leakage

Current

V

0.05

3.0

µA

V

IL

Input Low Level

(1)

–0.6

V

V

Input High Level

(1)

V

V

OL1

Output Low Level

V

I

0.2

V

V

OL2

Output Low Level

V

I

0.4

V