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WS27C256L-15TMB Datasheet(PDF) 2 Page - STMicroelectronics |
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WS27C256L-15TMB Datasheet(HTML) 2 Page - STMicroelectronics |
2 / 5 page AC READ CHARACTERISTICS Over Operating Range (See Above) SYMBOL PARAMETER WS27C256L-12 WS27C256L-15 WS27C256L-20 UNITS MIN MAX MIN MAX MIN MAX tACC Address to Output Delay 120 150 200 tCE CE to Output Delay 120 150 200 tOE OE to Output Delay 35 40 40 tDF Output Disable to Output Float 35 40 40 ns (Note 3) Output Hold From Addresses, tOH CE or OE, Whichever Occurred 0 0 0 First (Note 3) DC READ CHARACTERISTICS Over Operating Range. (See Above) SYMBOL PARAMETER TEST CONDITIONS MIN MAX UNITS VIL Input Low Voltage –0.5 0.8 V VIH Input High Voltage 2.0 VCC + 1 V VOL Output Low Voltage IOL = 2.1 mA 0.4 V VOH Output High Voltage IOH = –400 µA 3.5 V ISB1 VCC Standby Current (CMOS) CE = VCC ± 0.3 V (Note 2) 100 µA ISB2 VCC Standby Current CE = VIH 1mA ICC VCC Active Current CE = OE = VIL F = 5 MHz 40 mA (Note 1) F = 8 MHz 50 mA IPP VPP Supply Current VPP = VCC 100 µA VPP VPP Read Voltage VCC –0.4 VCC V ILI Input Leakage Current VIN = 5.5 V or Gnd –10 10 µA ILO Output Leakage Current VOUT = 5.5 V or Gnd –10 10 µA WS27C256L 4-20 OPERATING RANGE RANGE TEMPERATURE VCC Military –55°C to +125°C +5V ± 10% ABSOLUTE MAXIMUM RATINGS* Storage Temperature............................–65° to + 150°C Voltage on any Pin with Respect to Ground ....................................–0.6V to +7V VPP with Respect to Ground...................–0.6V to + 14V VCC Supply Voltage with Respect to Ground ....................................–0.6V to +7V ESD Protection .................................................. >2000V NOTES: 1. The supply current is the sum of ICC and IPP. The maximum current value is with Outputs O0 to O7 unloaded. 2. CMOS inputs: VIL = GND ± 0.3V, VIH = VCC ± 0.3 V. *NOTICE: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect device reliability. NOTE: 3. This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven – see timing diagram. |
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