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M1A3P1000-1PQ144M Datasheet(PDF) 7 Page - Actel Corporation |
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M1A3P1000-1PQ144M Datasheet(HTML) 7 Page - Actel Corporation |
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7 / 181 page  Military ProASIC3/EL Device Family Overview v1.0 1 - 3 reduce cost and design risk while increasing system reliability and improving system initialization time. Reduced Cost of Ownership Advantages to the designer extend beyond low unit cost, performance, and ease of use. Unlike SRAM-based FPGAs, flash-based military ProASIC3/EL devices allow all functionality to be live at power-up; no external boot PROM is required. On-board security mechanisms prevent access to all the programming information and enable secure remote updates of the FPGA logic. Designers can perform secure remote in-system reprogramming to support future design iterations and field upgrades with confidence that valuable intellectual property cannot be compromised or copied. Secure ISP can be performed using the industry-standard AES algorithm. The military ProASIC3/EL family device architecture mitigates the need for ASIC migration at higher volumes. This makes the military ProASIC3/EL family a cost-effective ASIC replacement. Firm-Error Immunity Firm errors occur most commonly when high-energy neutrons, generated in the upper atmosphere, strike a configuration cell of an SRAM FPGA. The energy of the collision can change the state of the configuration cell and thus change the logic, routing, or I/O behavior in an unpredictable way. These errors are impossible to prevent in SRAM FPGAs. The consequence of this type of error can be a complete system failure. Firm errors do not exist in the configuration memory of military ProASIC3/EL flash-based FPGAs. Once it is programmed, the flash cell configuration element of military ProASIC3/EL FPGAs cannot be altered by high-energy neutrons and is therefore immune to them. Recoverable (or soft) errors occur in the user data SRAM of all FPGA devices. These can easily be mitigated by using error detection and correction (EDAC) circuitry built into the FPGA fabric. Advanced Flash Technology The military ProASIC3/EL family offers many benefits, including nonvolatility and reprogrammability, through an advanced flash-based, 130-nm LVCMOS process with 7 layers of metal. Standard CMOS design techniques are used to implement logic and control functions. The combination of fine granularity, enhanced flexible routing resources, and abundant flash switches allows for very high logic utilization without compromising device routability or performance. Logic functions within the device are interconnected through a four-level routing hierarchy. Advanced Architecture The proprietary military ProASIC3/EL architecture provides granularity comparable to standard-cell ASICs. The military ProASIC3/EL device consists of five distinct and programmable architectural features (Figure 1-1 on page 1-4 and Figure 1-2): • FPGA VersaTiles • Dedicated FlashROM • Dedicated SRAM/FIFO memory • Extensive CCCs and PLLs • I/O structure The FPGA core consists of a sea of VersaTiles. Each VersaTile can be configured as a three-input logic function, a D-flip-flop (with or without enable), or a latch by programming the appropriate flash switch interconnections. The versatility of the military ProASIC3/EL core tile, as either a three- input lookup table (LUT) equivalent or a D-flip-flop/latch with enable, allows for efficient use of the FPGA fabric. The VersaTile capability is unique to the Actel ProASIC family of third-generation- architecture flash FPGAs. VersaTiles are connected with any of the four levels of routing hierarchy. Flash switches are distributed throughout the device to provide nonvolatile, reconfigurable interconnect programming. Maximum core utilization is possible for virtually any design. |
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