CY54/74FCT373T

CY54/74FCT573T

2

(Above which the useful life may be impaired. For user guide-

lines, not tested.)

Storage Temperature ................................. –65

°C to +150°C

Ambient Temperature with

Power Applied ............................................. –65

°C to +135°C

Supply Voltage to Ground Potential ............... –0.5V to +7.0V

DC Input Voltage ........................................... –0.5V to +7.0V

DC Output Voltage......................................... –0.5V to +7.0V

DC Output Current (Maximum Sink Current/Pin) ...... 120 mA

Power Dissipation .......................................................... 0.5W

Static Discharge Voltage............................................>2001V

(per MIL-STD-883, Method 3015)

Inputs

Outputs

OE

LE

D

O

L

H

H

H

L

H

L

L

L

L

X

H

X

X

Z

Operating Range

Range

Range

Ambient

Temperature

Commercial

T, AT, CT

–40

°C to +85°C

5V

± 5%

All

–55

°C to +125°C

5V

± 10%

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

Com’l

2.0

V

Com’l

2.4

3.3

V

Mil

2.4

3.3

V

Output LOW Voltage

Com’l

0.3

0.55

V

Mil

0.3

0.55

V

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

All inputs

0.2

V

Input Clamp Diode Voltage

–0.7

–1.2

V

Input HIGH Current

5

µA

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

Off State HIGH-Level Output

Current

10

µA

Off State LOW-Level

Output Current

–10

µA

–60

–120

–225

mA

Power-Off Disable

±1

µA

Notes:

1.

H = HIGH Voltage Level

L = LOW Voltage Level

X = Don’t Care

Z = HIGH Impedance

2.

Unless otherwise noted, these limits are over the operating free-air temperature range.

3.

4.

5.

6.

This parameter is specified but not tested.

7.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter