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SN54ABTH182652AHV Datasheet(PDF) 3 Page - Texas Instruments

Part # SN54ABTH182652AHV
Description  SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
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Manufacturer  TI [Texas Instruments]
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SN54ABTH182652AHV Datasheet(HTML) 3 Page - Texas Instruments

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SN54ABTH18652A, SN54ABTH182652A, SN74ABTH18652A, SN74ABTH182652A
SCAN TEST DEVICES WITH
18-BIT BUS TRANSCEIVERS AND REGISTERS
SCBS167D – AUGUST 1993 – REVISED JULY 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
In the test mode, the normal operation of the SCOPE
™ bus transceivers and registers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin
architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A
PSA/COUNT instruction is also included to ease the testing of memories and other circuits where a binary count
addressing scheme is useful.
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
The B-port outputs of ’ABTH182652A, which are designed to source or sink up to 12 mA, include 25-
Ω series
resistors to reduce overshoot and undershoot.
The SN54ABTH18652A and SN54ABTH182652A are characterized for operation over the full military
temperature range of – 55
°C to 125°C. The SN74ABTH18652A and SN74ABTH182652A are characterized for
operation from – 40
°C to 85°C.
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
DATA I/O
OPERATION OR FUNCTION
OEAB
OEBA
CLKAB
CLKBA
SAB
SBA
A1 – A9
B1 – B9
OPERATION OR FUNCTION
L
H
L
L
X
X
Input disabled
Input disabled
Isolation
L
H
↑↑
X
X
Input
Input
Store A and B data
X
H
L
X
X
Input
Unspecified†
Store A, hold B
H
H
↑↑
X‡
X
Input
Output
Store A in both registers
L
XL
X
X
Unspecified†
Input
Hold A, store B
L
L
↑↑
XX‡
Output
Input
Store B in both registers
L
L
X
X
X
L
Output
Input
Real-time B data to A bus
L
L
X
X
X
H
Output
Input
Stored B data to A bus
H
H
X
X
L
X
Input
Output
Real-time A data to B bus
H
H
X
X
H
X
Input
Output
Stored A data to B bus
H
L
X
X
H
H
Output
Output
Stored A data to B bus and
stored B data to A bus
† The data-output functions can be enabled or disabled by a variety of level combinations at OEAB or OEBA. Data-input functions are always
enabled; i.e., data at the bus pins is stored on every low-to-high transition on the clock inputs.
‡ Select control = L: clocks can occur simultaneously.
Select control = H: clocks must be staggered to load both registers.


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