SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512

3.3-V ABT SCAN TEST DEVICES

WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997

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POST OFFICE BOX 655303

SCOPE

™ Family of Testability Products

Widebus

™ Family

Mixed-Mode Signal Operation (5-V Input

Down to 2.7 V

Combines D-Type Latches and D-Type

Flip-Flops for Operation in Transparent,

Latched, or Clocked Mode

Need for External Pullup/Pulldown

Resistors

Have Equivalent 25-

Ω Series Resistors, So

No External Resistors Are Required

(JTAG) Test Access Port and

Boundary-Scan Architecture

– IEEE Std 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

– Even-Parity Opcodes

Thin Shrink Small Outline (DGG) and 64-Pin

Ceramic Dual Flat (HKC) Packages Using

0.5-mm Center-to-Center Spacings

description

The ’LVTH18512 and ’LVTH182512 scan test devices with 18-bit universal bus transceivers are members of

the Texas Instruments SCOPE

™ testability integrated-circuit family. This family of devices supports IEEE Std

1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test

circuitry is accomplished via the 4-wire test access port (TAP) interface.

capability to provide a TTL interface to a 5-V system environment.

Copyright

© 1997, Texas Instruments Incorporated

UNLESS OTHERWISE NOTED this document contains PRODUCTION

DATA information current as of publication date. Products conform to

specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all

parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.

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1CLKAB

1LEAB

1OEAB

1A1

1A2

GND

1A3

1A4

1A5

1A6

1A7

1A8

GND

1A9

2A1

2A2

2A3

GND

2A4

2A5

2A6

2A7

2A8

2A9

GND

2OEAB

2LEAB

2CLKAB

TDO

TMS

1CLKBA

1LEBA

1OEBA

1B1

1B2

GND

1B3

1B4

1B5

1B6

1B7

1B8

GND

1B9

2B1

2B2

2B3

GND

2B4

2B5

2B6

2B7

2B8

2B9

GND

2OEBA

2LEBA

2CLKBA

TDI

TCK

SN54LVTH18512, SN54LVTH182512 . . . HKC PACKAGE

SN74LVTH18512, SN74LVTH182512 . . . DGG PACKAGE

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