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SN64BCT25244 Datasheet(PDF) 1 Page - Texas Instruments |
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SN64BCT25244 Datasheet(HTML) 1 Page - Texas Instruments |
1 / 5 page SN64BCT25244 25- Ω OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS SCBS477 – DECEMBER 1992 – REVISED JANUARY 1994 Copyright © 1994, Texas Instruments Incorporated 3–1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 • State-of-the-Art BiCMOS Design Significantly Reduces ICCZ • High-Impedance State During Power Up and Power Down • ESD Protection Exceeds 2000 V Per MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) • Designed to Facilitate Incident-Wave Switching for Line Impedances of 25 Ω or Greater • Distributed V CC and GND Pins Minimize Noise Generated by the Simultaneous Switching of Outputs • Package Options Include Plastic Small-Outline (DW) Packages and Standard Plastic 300-mil DIPs (NT) description The SN64BCT25244 is a 25- Ω octal buffer and line driver designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented transceivers. When the output-enable (1OE and 2OE) inputs are low, the device transmits data from the A inputs to the Y outputs. When 1OE and 2OE are high, the outputs are in the high-impedance state. This buffer/driver is capable of sinking 188-mA IOL, which facilitates switching 25-Ω transmission lines on the incident wave. The distributed VCC and GND pins minimize switching noise for more reliable system operation. The outputs are in a high-impedance state during power up and power down while the supply voltage value is less than approximately 3 V. The SN64BCT25244 is characterized for operation from – 40 °C to 85°C and 0°C to 70°C. FUNCTION TABLE (each buffer/driver) INPUTS OUTPUT OE A Y L H H L LL H X Z 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 1Y1 GND 1Y2 1Y3 GND 1Y4 2Y1 GND 2Y2 2Y3 GND 2Y4 1OE 1A1 1A2 VCC 1A3 1A4 2A1 2A2 VCC 2A3 2A4 2OE DW OR NT PACKAGE (TOP VIEW) PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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