26PC Series (mbar)
Temp. compensated and calibrated pressure sensors
2/4
June 2005 / 596
www.sensortechnics.com
COMMON PERFORMANCE CHARACTERISTICS
V
s = 10.0 ± 0.01 V, tamb = 25°C (unless otherwise noted)
Specification notes:
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
The maximum specified pressure which may be applied to the sensor without causing a permanent change in the output characteristics.
Span is the algebraic difference between the output voltage at full-scale pressure and the output at zero pressure. Span is
ratiometric to the supply voltage.
Linearity (BSL), the deviation of measured output at constant temperature (25°C) from "Best Straight Line" determined by three
points, offset pressure, full-scale pressure and half full-scale pressure.
Error band of the offset voltage, span or bridge impedance in the specified temperature range, relative to the 25°C reading.
Repeatability, the deviation in output readings for successive application of any given input pressure (all other conditions
remaining constant. Hysteresis, the error defined by the deviation in output signal obtained when a specific pressure point is
approached first with increasing pressure, then with decreasing pressure or vice versa (all other conditions remaining constant).
Response time for 0 to full-scale pressure step change, readings taken at 10 % and 90 % of full-scale pressure.
Long term stability of offset and span over a period over one year.
The sensors might be used on both ports, for media compatible with the components, specified under "Service" (page 1).
Other sealing materials are available on request. Minimum order quantities might be required.
Other pressure port styles, like barbed ones, luers, modular, M5, needle style or flow through connection, are
available on request. Minimum order quantities might be required.
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PRESSURE SENSOR CHARACTERISTICS
V
s = 10.0 ± 0.01 V, tamb = 20°C (unless otherwise noted)
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4
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7
4
1r
a
b
/
V
m
7
.
8
[ V
½ full scale –
{
Vfull scale - Voffset
(full scale pressure)
x (½ full scale pressure) + Voffset
}] : 2 (V
full scale) x 100 %
where: V = measured value for each device