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TIBPAL16L8-7MFK Datasheet(PDF) 10 Page - Texas Instruments |
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TIBPAL16L8-7MFK Datasheet(HTML) 10 Page - Texas Instruments |
10 / 30 page ns Pulse duration, clock tw TIBPAL16R4-5C, TIBPAL16R6-5C HIGH-PERFORMANCE IMPACT-X ™ PAL® CIRCUITS SRPS011D – D3359, OCTOBER 1989 – REVISED SEPTEMBER 1992 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 10 PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage, VCC (see Note 1) 7 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage (see Note 1) 5.5 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltage applied to disabled output (see Note 1) 5.5 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Operating free-air temperature range 0 °C to 75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature range – 65 °C to 150°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . NOTE 1: These ratings apply except for programming pins during a programming cycle or during a preload cycle. recommended operating conditions MIN NOM MAX UNIT VCC Supply voltage 4.75 5 5.25 V VIH High-level input voltage (see Note 2) 2 5.5 V VIL Low-level input voltage (see Note 2) 0.8 V IOH High-level output current – 3.2 mA IOL Low-level output current 24 mA fclock Clock frequency 0 125 MHz High 4 Low 4 tsu Setup time, input or feedback before clock ↑ 4.5 ns th Hold time, input or feedback after clock ↑ 0 ns TA Operating free-air temperature 0 25 75 °C NOTE 2: These are absolute voltage levels with respect to the ground pin of the device and include all overshoots due to system and/or tester noise. Testing these parameters should not be attempted without suitable equipment. |
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