TLC5615C, TLC5615I

10-BIT DIGITAL-TO-ANALOG CONVERTERS

SLAS142C – OCTOBER 1996 – REVISED MARCH 2000

4

POST OFFICE BOX 655303

reference input (REFIN)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VI

Input voltage

0

VDD–2

V

ri

Input resistance

10

M

Ω

Ci

Input capacitance

5

pF

digital inputs (DIN, SCLK, CS)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VIH

High-level digital input voltage

2.4

V

VIL

Low-level digital input voltage

0.8

V

IIH

High-level digital input current

VI = VDD

±1

µA

IIL

Low-level digital input current

VI = 0

±1

µA

Ci

Input capacitance

8

pF

digital output (DOUT)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VOH

Output voltage, high-level

IO = –2 mA

VDD–1

V

VOL

Output voltage, low-level

IO = 2 mA

0.4

V

power supply

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VDD

Supply voltage

4.5

5

5.5

V

IDD

Power supply current

VDD = 5.5 V,

No load,

All inputs = 0 V or VDD

Vref = 0

150

250

µA

IDD

Power supply current

VDD = 5.5 V,

No load,

All inputs = 0 V or VDD

Vref = 2.048 V

230

350

µA

analog output dynamic performance

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Signal-to-noise + distortion, S/(N+D)

Vref = 1 Vpp at 1 kHz + 2.048 Vdc,

code = 11 1111 1111,

See Note 9

60

dB

NOTE 9: The limiting frequency value at 1 Vpp is determined by the output-amplifier slew rate.