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TPIC1502DW Datasheet(PDF) 1 Page - Texas Instruments |
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TPIC1502DW Datasheet(HTML) 1 Page - Texas Instruments |
1 / 16 page TPIC1502 QUAD AND HEX POWER DMOS ARRAY SLIS054 – OCTOBER 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Low rDS(on): 0.25 Ω Typ (Full H-Bridge) 0.4 Ω Typ (Triple Half H-Bridge) D Pulsed Current...4 A Per Channel D Matched Sense Transistors for Class A-B Linear Operation D Fast Commutation Speed description The TPIC1502 is a monolithic power DMOS array that consists of ten electrically isolated N-channel enhancement-mode power DMOS transistors, four of which are configured as a full H-bridge and six as a triple half H-bridge. The lower stage of the full H-bridge is provided with an integrated sense-FET to allow biasing of the bridge in class A-B operation. The TPIC1502 is offered in a 24-pin wide-body surface-mount (DW) package and is characterized for operation over the case temperature range of – 40 °C to 125°C. schematic Q4B GATE1A 17 OUTPUT1 19 GATE1B 21 Q2A 9 Q2B 7 5 D1 D2 GATE3A 22 OUTPUT3 1 GATE3B 4 D3 GATE4A Q4A OUTPUT4 GATE4B 8 GATE2A OUTPUT2 GATE2B Q3B Q3A 15 11 Q1B Q1A GATE5A Q5A 16 OUTPUT5 GATE5B 24 2, 12 3, 23 GND SOURCE VDD1 VDD2 VDD3 SENSE 20 Q2C 6 GATE2C 6 V 18 14 13 Q5B 10 NOTES: A. Terminals 3 and 23 must be externally connected. B. Terminals 2 and 12 must be externally connected. C. No output may be taken greater than 0.5 V below GND. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 8 9 10 11 12 24 23 22 21 20 19 18 17 16 15 14 13 OUTPUT3 SOURCE GND GATE3B GATE2B GATE2C OUTPUT2 GATE4B GATE2A GATE5B VDD2 SOURCE VDD3 GND GATE3A GATE1B SENSE OUTPUT1 GATE4A GATE1A GATE5A VDD1 OUTPUT4 OUTPUT5 DW PACKAGE (TOP VIEW) PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 1996, Texas Instruments Incorporated |
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