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PCS2I2314ANZG-28-ST Datasheet(PDF) 6 Page - PulseCore Semiconductor

Part # PCS2I2314ANZG-28-ST
Description  14 Output, 3.3V SDRAM Buffer for Desktop PCs with 3 DIMMs
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Manufacturer  PULSECORE [PulseCore Semiconductor]
Direct Link  http://www.onsemi.com/
Logo PULSECORE - PulseCore Semiconductor

PCS2I2314ANZG-28-ST Datasheet(HTML) 6 Page - PulseCore Semiconductor

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September 2006
PCS2I2314ANZ
rev 0.5
14 Output, 3.3V SDRAM Buffer for Desktop PCs with 3 DIMMs
6 of 13
Notice: The information in this document is subject to change without notice.
Switching Characteristics
1
Parameter
Name
Test Conditions
Min
Typ
Max
Unit
Fin
Maximum Operating Frequency
133
MHz
tD
Duty cycle
2,3 = t2 ÷ t1
Measured at 1.5V
45.0
50.0
55.0
%
t3
Rising Edge Rate
3
Measured between 0.4V and
2.4V
1
2
4
V/nS
t4
Falling Edge Rate
3
Measured between 2.4V and
0.4V
1
2
4
V/nS
t5
Output to Output Skew
3
All outputs equally loaded
150
225
pS
t6
SDRAM Buffer LH Prop. Delay
3
Input edge greater than 1 V/nS
1
2.7
3.5
nS
t7
SDRAM Buffer HL Prop. Delay
3
Input edge greater than 1 V/nS
1
2.7
3.5
nS
tPLZ, tPHZ
SDRAM Buffer Enable Delay
3
Input edge greater than 1 V/nS
1
3
5
nS
tPZL, tPZH
SDRAM Buffer Disable Delay
3
Input edge greater than 1 V/nS
1
3
5
nS
CL = 10pF
6
tr
Rise Time for SDATA
(Refer Test Circuit for IIC)
Refer figure no.3
CL = 400pF
250
nS
CL = 10pF
20
tf
Fall Time for SDATA
(Refer Test Circuit for IIC)
Refer figure no.3
CL = 400pF
250
nS
Note: 1. All parameters specified with loaded outputs.
2. Duty cycle of input clock is 50%. Rising and falling edge rate is greater than 1V/nS
3. Parameter is guaranteed by design and characterization. Not 100% tested in production.
Test Circuit for SDRAM Enable and Disable Times
Figure 1. Load circuit for Switching times
PULSE
GENERATOR
D.U.T
VO
VI
VDD
RT
500Ω
S1
500Ω
CL
2 * VDD
Open
VSS
VSS
TEST
S1
t6/t7
Open
tPLZ/tPZL
2* VDD
tPHZ/tPZH
VSS


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