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PCS5I961CG-32-ET Datasheet(PDF) 8 Page - PulseCore Semiconductor |
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PCS5I961CG-32-ET Datasheet(HTML) 8 Page - PulseCore Semiconductor |
8 / 14 page November 2006 PCS5I961C rev 0.3 Low Voltage Zero Delay Buffer 8 of 14 Notice: The information in this document is subject to change without notice. Due to the statistical nature of I/O jitter a rms value (1 σ) is specified. I/O jitter numbers for other confidence factors (CF) can be derived from Table 8. Table 8: Confidence Factor CF CF Probability of clock edge within the distribution ± 1σ 0.68268948 ± 2σ 0.95449988 ± 3σ 0.99730007 ± 4σ 0.99993663 ± 5σ 0.99999943 ± 6σ 0.99999999 The feedback trace delay is determined by the board layout and can be used to fine-tune the effective delay through each device. In the following example calculation a I/O jitter confidence factor of 99.7% (± 3 σ) is assumed, resulting in a worst case timing uncertainty from input to any output of -275 pS to 315 pS relative to CCLK: tSK(PP) = [–80pS...120pS] + [–150pS...150pS] + [(15pS* –3)...(15pS* 3)] + tPD, LINE(FB) tSK(PP) = [–275pS...315pS] + tPD, LINE(FB) Due to the frequency dependence of the I/O jitter, Figure 8. “Max. I/O Jitter versus frequency” can be used for a more precise timing performance analysis. Figure 8. Max. I/O Jitter versus frequency Power Consumption of the PCS5I961C and Thermal Management The PCS5I961C AC specification is guaranteed for the entire operating frequency range up to 200MHz. The PCS5I961C power consumption and the associated long- term reliability may decrease the maximum frequency limit, depending on operating conditions such as clock frequency, supply voltage, output loading, ambient temperature, vertical convection and thermal conductivity of package and board. This section describes the impact of these parameters on the junction temperature and gives a guideline to estimate the PCS5I961C die junction temperature and the associated device reliability. Table 9: Die junction temperature and MTBF Junction temperature (°C) MTBF (Years) 100 20.4 110 9.1 120 4.2 130 2.0 Increased power consumption will increase the die junction temperature and impact the device reliability (MTBF). According to the system-defined tolerable MTBF, the die junction temperature of the PCS5I961C needs to be controlled and the thermal impedance of the board/package should be optimized. The power dissipated in the PCS5I961C is represented in equation 1. Where ICCQ is the static current consumption of the PCS5I961C, CPD is the power dissipation capacitance per output, (M)ΣCL represents the external capacitive output load, N is the number of active outputs (N is always 27 in case of the PCS5I961C). The PCS5I961C supports driving transmission lines to maintain high signal integrity and tight timing parameters. Any transmission line will hide the lumped capacitive load at the end of the board trace, therefore, ΣCL is zero for controlled transmission line systems and can be eliminated from equation 1. Using parallel termination output termination results in equation 2 for power dissipation. In equation 2, P stands for the number of outputs with a parallel or thevenin termination, VOL, IOL, VOH and IOH are a function of the output termination technique and DCQ is the clock signal duty cycle. If transmission lines are used ΣCL is zero in equation 2 and can be eliminated. In general, the use of controlled transmission line techniques eliminates the impact of the lumped capacitive loads at the end lines and greatly reduces the power dissipation of the device. Equation 3 describes the die junction temperature TJ as a function of the power consumption. 0 50 70 90 110 130 190 Clock frequency [MHz] 2 10 12 14 16 18 F_RANGE=1 8 6 4 TA = 85°C 170 150 F_RANGE=0 VCC=3.3V VCC=2.5V VCC=2.5V VCC=3.3V |
Similar Part No. - PCS5I961CG-32-ET |
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Similar Description - PCS5I961CG-32-ET |
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