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CY7C1059DV33
Document #: 001-00061 Rev. *D
Page 4 of 10
AC Test Loads and Waveforms
AC characteristics (except High-Z) are tested using the load conditions shown in Figure 2 (a). High-Z characteristics are tested for all
speeds using the test load shown in Figure 2 (c).
Figure 2. AC Test Loads and Waveforms
Figure 3. Data Retention Waveform
90%
10%
3.0V
GND
90%
10%
ALL INPUT PULSES
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
Rise Time: 1 V/ns
Fall Time: 1 V/ns
30 pF*
OUTPUT
Z = 50
Ω
50
Ω
1.5V
(b)
(a)
3.3V
OUTPUT
5 pF
(c)
R 317
Ω
R2
351
Ω
High-Z characteristics:
Data Retention Characteristics
Over the Operating Range
Parameter
Description
Conditions[4]
Min
Max
Unit
VDR
VCC for Data Retention
2.0
V
ICCDR
Data Retention Current
VCC = VDR = 2.0V, CE > VCC – 0.3V,
VIN > VCC – 0.3V or VIN < 0.3V
20
mA
tCDR[3]
Chip Deselect to Data
Retention Time
0ns
tR[5]
Operation Recovery Time
tRC
ns
3.0V
3.0V
tCDR
VDR > 2V
DATA RETENTION MODE
tR
CE
VCC
Notes
4. No inputs may exceed VCC + 0.3V.
5. Full device operation requires linear VCC ramp from VDR to VCC(min) > 50 μs or stable at VCC(min) > 50 μs.
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