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ADN4666ARUZ Datasheet(PDF) 4 Page - Analog Devices

Part # ADN4666ARUZ
Description  3 V, LVDS, Quad CMOS Differential Line Receiver
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADN4666ARUZ Datasheet(HTML) 4 Page - Analog Devices

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ADN4666
Rev. 0 | Page 4 of 12
TIMING SPECIFICATIONS
VCC = 3.0 V to 3.6 V, CL = 15 pF to GND, all specifications TMIN to TMAX, unless otherwise noted.1
Table 2.
Parameter2
Symbol
Min
Typ3
Max
Unit
Test Conditions/Comments4, 5
AC CHARACTERISTICS
Differential Propagation Delay, High to Low
tPHLD
1.8
3.3
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Differential Propagation Delay, Low to High
tPLHD
1.8
3.3
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Differential Pulse Skew6 |tPHLD − tPLHD|
tSKD1
0
0.1
0.35
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Differential Channel-to-Channel Skew
(Same Device)7
tSKD2
0
0.1
0.5
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Differential Part-to-Part Skew8
tSKD3
1.0
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Differential Part-to-Part Skew9
tSKD4
1.5
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Rise Time
tTLH
0.35
1.2
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Fall Time
tTHL
0.35
1.2
ns
CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3)
Disable Time, High to Z
tPHZ
8
12
ns
RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5)
Disable Time, Low to Z
tPLZ
8
12
ns
RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5)
Enable Time, Z to High
tPZH
11
17
ns
RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5)
Enable Time, Z to Low
tPZL
11
17
ns
RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5)
Maximum Operating Frequency10
fMAX
200
250
MHz
All channels switching
SIGNAL
GENERATOR
RECEIVER
IS ENABLED
1 Generator waveform for all tests, unless otherwise specified: f = 1 MHz, ZO = 50 Ω, tTLH and tTHL (0% to 100%)
≤ 3 ns for R
INx+
/RINx−.
2 AC parameters are guaranteed by design and characterization.
3 All typical values are given for VCC = 3.3 V and TA = 25°C.
4 Current into device pins is defined as positive. Current out of device pins is defined as negative. All voltages are referenced to ground, unless otherwise specified.
5 CL includes load and jig capacitance.
6 tSKD1 is the magnitude difference in the differential propagation delay time between the positive-going edge and the negative-going edge of the same channel.
7 Channel-to-channel skew, tSKD2, is defined as the difference between the propagation delay of one channel and that of the others on the same chip with any event on
the inputs.
8 tSKD3 part-to-part skew is the differential channel-to-channel skew of any event between devices. The tSKD3 specification applies to devices at the same VCC and within
5°C of each other within the operating temperature range.
9 tSKD4 part-to-part skew is the differential channel-to-channel skew of any event between devices. The tSKD4 specification applies to devices over the recommended
operating temperature and voltage ranges and across process distribution. tSKD4 is defined as |maximum − minimum| differential propagation delay.
10 fMAX generator input conditions: f = 200 MHz, tTLH = tTHL < 1 ns (0% to 100%), 50% duty cycle, differential (1.05 V to 1.35 V p-p). fMAX generator output criteria: 60%/40%
duty cycle, VOL (maximum = 0.4 V), VOH (minimum = 2.7 V), and load = 15 pF (stray plus probes).
Test Circuits and Timing Diagrams
V
RINx+
RINx–
CL
NOTES
1. CL = LOAD AND TEST JIG CAPACITANCE.
CC
ROUTx
50
50
Figure 2. Test Circuit for Receiver Propagation Delay and Transition Time


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