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ADN4666ARUZ Datasheet(PDF) 4 Page - Analog Devices |
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ADN4666ARUZ Datasheet(HTML) 4 Page - Analog Devices |
4 / 12 page ADN4666 Rev. 0 | Page 4 of 12 TIMING SPECIFICATIONS VCC = 3.0 V to 3.6 V, CL = 15 pF to GND, all specifications TMIN to TMAX, unless otherwise noted.1 Table 2. Parameter2 Symbol Min Typ3 Max Unit Test Conditions/Comments4, 5 AC CHARACTERISTICS Differential Propagation Delay, High to Low tPHLD 1.8 3.3 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Differential Propagation Delay, Low to High tPLHD 1.8 3.3 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Differential Pulse Skew6 |tPHLD − tPLHD| tSKD1 0 0.1 0.35 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Differential Channel-to-Channel Skew (Same Device)7 tSKD2 0 0.1 0.5 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Differential Part-to-Part Skew8 tSKD3 1.0 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Differential Part-to-Part Skew9 tSKD4 1.5 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Rise Time tTLH 0.35 1.2 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Fall Time tTHL 0.35 1.2 ns CL = 15 pF, VID = 300 mV (see Figure 2 and Figure 3) Disable Time, High to Z tPHZ 8 12 ns RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5) Disable Time, Low to Z tPLZ 8 12 ns RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5) Enable Time, Z to High tPZH 11 17 ns RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5) Enable Time, Z to Low tPZL 11 17 ns RL = 2 kΩ, CL = 15 pF (see Figure 4 and Figure 5) Maximum Operating Frequency10 fMAX 200 250 MHz All channels switching SIGNAL GENERATOR RECEIVER IS ENABLED 1 Generator waveform for all tests, unless otherwise specified: f = 1 MHz, ZO = 50 Ω, tTLH and tTHL (0% to 100%) ≤ 3 ns for R INx+ /RINx−. 2 AC parameters are guaranteed by design and characterization. 3 All typical values are given for VCC = 3.3 V and TA = 25°C. 4 Current into device pins is defined as positive. Current out of device pins is defined as negative. All voltages are referenced to ground, unless otherwise specified. 5 CL includes load and jig capacitance. 6 tSKD1 is the magnitude difference in the differential propagation delay time between the positive-going edge and the negative-going edge of the same channel. 7 Channel-to-channel skew, tSKD2, is defined as the difference between the propagation delay of one channel and that of the others on the same chip with any event on the inputs. 8 tSKD3 part-to-part skew is the differential channel-to-channel skew of any event between devices. The tSKD3 specification applies to devices at the same VCC and within 5°C of each other within the operating temperature range. 9 tSKD4 part-to-part skew is the differential channel-to-channel skew of any event between devices. The tSKD4 specification applies to devices over the recommended operating temperature and voltage ranges and across process distribution. tSKD4 is defined as |maximum − minimum| differential propagation delay. 10 fMAX generator input conditions: f = 200 MHz, tTLH = tTHL < 1 ns (0% to 100%), 50% duty cycle, differential (1.05 V to 1.35 V p-p). fMAX generator output criteria: 60%/40% duty cycle, VOL (maximum = 0.4 V), VOH (minimum = 2.7 V), and load = 15 pF (stray plus probes). Test Circuits and Timing Diagrams V RINx+ RINx– CL NOTES 1. CL = LOAD AND TEST JIG CAPACITANCE. CC ROUTx 50 Ω 50 Ω Figure 2. Test Circuit for Receiver Propagation Delay and Transition Time |
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