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LT1007CDWF Datasheet(PDF) 2 Page - Linear Technology |
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LT1007CDWF Datasheet(HTML) 2 Page - Linear Technology |
2 / 2 page DICE/DWF SPECIFICATION 2 LT1007 1007dice/dwffa Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2009 I.D.No. 66-13-1007 • LT 1009 REV A • PRINTED IN USA Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. |
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