EUP7915-285VIR1 datasheet(5/11 Pages) EUTECH

Part #	EUP7915-285VIR1

Description	150mA Low-Noise LDO in SOT23-5

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Manufacturer	EUTECH [Eutech Microelectronics Inc]

Direct Link	http://www.eutechmicro.com

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EUP7915

DS7915 Ver1.4 Apr. 2008

5

Electrical Characteristics

Conditions: VIN=VOUT+0.2V if VOUT≧2.5V, VIN=2.5V if VOUT<2.5V ,VEN=VIN, CIN=1uF, COUT=1uF,TA= -40~ 85℃

Unless otherwise specified. Typical values are at 25℃.

EUP7915

Symbol

Parameter

Conditions

Min

Typ

Max.

Unit

Input Voltage

2.5

5.5

V

IOUT=1mA,TA=25℃

-2

2

%

∆VOUT

Output Voltage Accuracy

IOUT=1mA,TA=-40℃ to 85℃

-3

3

%

IOUTMAX Maximum Output Current

TA>0, VIN=VOUT + 0.2V for

VOUT > 3.3V or VIN=VOUT +0.5V

150

mA

ILIMIT

Current Limit

VOUT=VOUT(nom)× 90%, TA>0℃

160

220

400

mA

IOUT=150mA, VOUT<3.3V

140

240

VDROP

Dropout Voltage (Note1)

IOUT=100mA, VOUT>3.3V

60

100

mV

IQ

Quiescent Current

IOUT=1mA

70

160

µA

VLNR

Line Regulation

VIN=(VOUT+0.2V) to 5.5V,

IOUT=1mA

0.02

0.25

%/V

VLDR

Load Regulation

1mA ≤ IOUT ≤ 100mA

(VIN=VOUT + 0.2V)

1mA ≤ IOUT ≤ 150mA

(VIN=VOUT + 0.5V)

0.002

0.013

%/mA

ISHDN

Shutdown Supply Current

VEN=0,TA=25℃

1

µA

PSRR

Power Supply Ripple

Rejection

VIN=(VOUT+1V)DC+0.5VP-P f=1kHz,

ILOAD=10mA

75

dB

Output Noise Voltage

(Bypass)

f=10Hz~100kHz, ILOAD=10mA

50

µV

Output Noise Voltage (ADJ) f=10Hz~100kHz, ILOAD=10mA

239

µV

Turn-on Time (Note2)

RLOAD=50Ω,TA=25℃

200

µs

VENL

VENL (Maximum Low Level

Input Voltage at EN)

VIN=2.5V to 5.5V

0.4

V

VENH

VENH (Minimum high Level

Input Voltage at EN)

VIN=2.5V to 5.5V

1.5

V

VEN Input Bias Current

VIN=5.5V, VEN=0 or 5.5V

1

nA

FB Input Bias Current (ADJ

Version)

VIN=5.5V, VFB=1.3V

1

nA

VFB

FB Pin Voltage (ADJ

Version)

TA=25℃

1.176

1.2

1.224

V

TSD

Thermal Shutdown

Temperature

155

℃

∆TSD

Thermal Shutdown

Hysteresis

15

℃

Note 1: The dropout voltage is defined as VIN-VOUT when VOUT is 100mV below the nominal value of VOUT.

Note 2: Test time needed for VOUT to reach 90% of final value.

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