9

8021ES–AVR–07/09

ATmega329P/3290P

3.

Resources

A comprehensive set of development tools, application notes and datasheets are available for

download on http://www.atmel.com/avr.

Note:

1.

4.

Data Retention

Reliability Qualification results show that the projected data retention failure rate is much less

than 1 PPM over 20 years at 85°C or 100 years at 25°C.

5.

About Code Examples

This documentation contains simple code examples that briefly show how to use various parts of

the device. These code examples assume that the part specific header file is included before

compilation. Be aware that not all C compiler vendors include bit definitions in the header files

and interrupt handling in C is compiler dependent. Please confirm with the C compiler documen-

tation for more details.

For I/O Registers located in extended I/O map, “IN”, “OUT”, “SBIS”, “SBIC”, “CBI”, and “SBI”

instructions must be replaced with instructions that allow access to extended I/O. Typically

“LDS” and “STS” combined with “SBRS”, “SBRC”, “SBR”, and “CBR”.