HANBit

HMF2M32B4VN

,URL: www.hbe.co.kr

HANBit Electronics Co., Ltd.

REV.02(August,2002)

5

ERASE AND PROGRAMMING PERFORMANCE

LIMITS

PARAMETER

MIN.

TYP.

MAX.

UNIT

COMMENTS

Sector Erase Time

-

0.7

15

Sec

Excludes 00H programming

prior to erasure

Byte Programming Time

-

9

300

µs

Excludes system-level

overhead

Chip Programming Time

-

18

54.8

Sec

Excludes system-level

overhead

CAPACITANCE

PARAMETER

SYMBOL

PARAMETER

DESCRIPTION

TEST SETUP

TYP.

MAX

UNIT

Input Capacitance

24

30

pF

Output Capacitance

34

4812

pF

Control Pin Capacitance

30

369

pF

AC CHARACTERISTICS

u Read Only Operations Characteristics

PARAMETER

SYMBOLS

Speed Options

JEDEC

STANDARD

DESCRIPTION

TEST SETUP

70R

80

-90

-120

UNIT

Read Cycle Time

Min

70

80

90

120

ns

Address to Output Delay

Max

70

80

90

120

ns

Chip Enable to Output Delay

Max

70

80

90

120

ns

Chip Enable to Output Delay

Max

30

30

35

50

ns

Chip Enable to Output High-Z

Max

25

25

30

30

ns

Output Enable to Output High -Z

Max

125

25

30

30

ns

Output Hold Time From Addresses,

/CE or /OE, Whichever Occurs First

Min

0

0

0

0

ns

Notes : Test Conditions

Output Load : 1TTL gate and Output Load Capacitance 100 pF, in case of 55ns-30pF

Input rise and fall times : 5 ns , In case of 55ns-5ns

Input pulse levels : 0 .45V to 2.4V, In case of 55ns- 0.0V-3.0V

Timing measurement reference level

Input : 0.8V, Incase of 55ns-1.5V

Output : 2.0V, In case of 55ns-1.5V