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NTGD3147F Datasheet(PDF) 2 Page - ON Semiconductor

Part # NTGD3147F
Description  Power MOSFET and Schottky Diode??0 V, ??.5 A, P?묬hannel with Schottky Barrier Diode, TSOP??
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NTGD3147F Datasheet(HTML) 2 Page - ON Semiconductor

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NTGD3147F
http://onsemi.com
2
MOSFET ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Characteristic
Symbol
Test Condition
Min
Typ
Max
Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
V(BR)DSS
VGS = 0 V, ID = 250 mA
−20
V
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(BR)DSS/TJ
14.2
mV/°C
Zero Gate Voltage Drain Current
IDSS
VGS = 0 V,
VDS = −16 V
TJ = 25°C
−1.0
mA
TJ = 85°C
−10
Gate−to−Source Leakage Current
IGSS
VDS = 0 V, VGS = ±12 V
±100
nA
ON CHARACTERISTICS (Note 3)
Gate Threshold Voltage
VGS(TH)
VGS = VDS, ID = −250 mA
−0.5
−0.95
−1.5
V
Gate Threshold Temperature Coefficient
VGS(TH)/TJ
3.0
mV/°C
Drain−to−Source On Resistance
RDS(on)
VGS = −4.5 V
ID = −2.2 A
90
145
mW
VGS = −2.5 V
ID = −1.6 A
140
200
Forward Transconductance
gFS
VDS = −5.0 V, ID = −2.2 A
4.5
S
CHARGES, CAPACITANCES AND GATE RESISTANCE
Input Capacitance
CISS
VGS = 0 V, f = 1.0 MHz,
VDS = −10 V
400
pF
Output Capacitance
COSS
75
Reverse Transfer Capacitance
CRSS
40
Total Gate Charge
QG(TOT)
VGS = −4.5 V, VDS = −10 V,
ID = −2.2 A
3.8
5.5
nC
Threshold Gate Charge
QG(TH)
0.5
Gate−to−Source Charge
QGS
0.9
Gate−to−Drain Charge
QGD
1.0
SWITCHING CHARACTERISTICS (Note 4)
Turn−On Delay Time
td(ON)
VGS = −4.5 V, VDS = −10 V,
ID = −1.0 A, RG = 6.0 W
7.5
ns
Rise Time
tr
6.2
Turn−Off Delay Time
td(OFF)
14.5
Fall Time
tf
18.4
DRAIN−TO−SOURCE CHARACTERISTICS
Forward Diode Voltage
VSD
VGS = 0 V
ID = −0.8 A
TJ = 25°C
−0.8
1.2
V
ns
Reverse Recovery Time
tRR
VGS = 0 V, dIS/dt = 100 A/ms,
IS = −0.8 A
12
Charge Time
Ta
8.0
Discharge Time
Tb
4.0
Reverse Recovery Time
QRR
4.0
nC
3. Pulse Test: pulse width v 300 ms, duty cycle v 2%.
4. Switching characteristics are independent of operating junction temperatures.


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