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BQ3060PWR Datasheet(PDF) 2 Page - Texas Instruments |
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BQ3060PWR Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 17 page  Coloumb Counter HWOver Current & ShortCircuit Protection CellVoltageMux & Translation P-Channel FETDrive PreCharge FETDrive PowerMode Control SMBD SRP SRN ZVCHG DSG CHG VC4 VC3 VC2 VC1 SMBC ExternalCell BalancingDriver Temperature Measurement DataFlash Memory SMB 1.1 CEDV GasGauging SHA-1 Authentication Over- & Under- Voltage Protection Voltage Measurement Over Current Protection Oscillator Charging Algorithm FuseBlow & Detection Logic Over Temperature Protection FUSE TS2 TS1 Watchdog Regulator REG27 BAT PACK VSS RBI System Control AFEHW Control Pack- RSNS 5m –20m typ. W W Pack+ SMBC SMBD bq3060 GND VC4 VC3 VC2 VC1 VDD OUT CD bq294xz PRES PRES bq3060 SLUS928A – MARCH 2009 – REVISED NOVEMBER 2009 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. SYSTEM PARTITIONING DIAGRAM ABSOLUTE MAXIMUM RATINGS Over operating free-air temperature range (unless otherwise noted) (1) VALUE UNIT VMAX Supply voltage range PACK w.r.t. Vss –0.3 to 34 V VC1, BAT VVC2–0.3 to VVC2+8.5 or 34, V whichever is lower VC2 VVC3–0.3 to VVC3+8.5 V VC3 VVC4–0.3 to VVC4+8.5 V VIN Input voltage range VC4 VSRP–0.3 to VSRP+8.5 V SRP, SRN –0.3 to VREG27 V SMBD, SMBC –0.3 to 6.0 V TS1, TS2, /PRES –0.3 to VREG27 + 0.3 V CHG, DSG, ZVCHG, FUSE –0.3 to BAT V VO Output voltage range RBI, REG27 –0.3 to 2.75 V ISS Maximum combined sink current for input pins 50 mA TFUNC Functional temperature –40 to 110 °C TSTG Storage temperature range –65 to 150 °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): bq3060 |
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