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TPS2561 Datasheet(PDF) 2 Page - Texas Instruments |
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TPS2561 Datasheet(HTML) 2 Page - Texas Instruments |
2 / 22 page TPS2560 TPS2561 SLVS930 – DECEMBER 2009 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. AVAILABLE OPTIONS AND ORDERING INFORMATION MARKING RECOMMENDED MAXIMUM AMBIENT SON (3) DEVICE(1) ENABLE CONTINUOUS LOAD CURRENT PER TEMPERATURE (2) (DRC) CHANNEL TPS2560 Active low TPS2560DRC 2560 –40°C to 85°C 2.5 A TPS2561 Active high TPS2561DRC 2561 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) Maximum ambient temperature is a function of device junction temperature and system level considerations, such as power dissipation and board layout. See dissipation rating table and recommended operating conditions for specific information related to these devices. (3) Add an R suffix to the device type for tape and reel. ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range unless otherwise noted (1) (2) VALUE UNIT Voltage range on IN, OUTx, ENx or ENx, ILIM, FAULTx –0.3 to 7 V Voltage range from IN to OUTx –7 to 7 V Continuous output current Internally Limited Continuous total power dissipation See the Dissipation Rating Table Continuous FAULTx sink current 25 mA ILIM source current Internally Limited mA HBM 2 kV ESD CDM 500 V ESD – system level (contact/air)(3) 8/15 kV TJ Maximum junction temperature –40 to OTSD2(4) °C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. (2) Voltages are referenced to GND unless otherwise noted. (3) Surges per EN61000-4-2, 1999 applied between USB and output ground of the TPS2560EVM (HPA424) evaluation module (documentation available on the Web.) These were the test level, no the failure threshold. (4) Ambient over temperature shutdown threshold DISSIPATION RATING TABLE THERMAL THERMAL TA ≤ 25°C RESISTANCE(1) RESISTANCE BOARD PACKAGE POWER θJA θJC RATING High-K(2) DRC 41.6 °C/W 10.7 °C/W 2403 mW (1) Mounting per the PowerPADTM Thermally Enhanced Package application report (SLMA002) (2) The JEDEC high-K (2s2p) board used to derive this data was a 3in × 3in, multilayer board with 1-ounce internal power and ground planes and 2-ounce copper traces on top and bottom of the board. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TPS2560 TPS2561 |
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