LDD525-64-XX-PF datasheet(9/9 Pages) LIGITEK

Part #	LDD525-64-XX-PF

Description	DUAL DIGIT LED DISPLAY (0.56 lnch)

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Manufacturer	LIGITEK [LIGITEK electronics co., ltd.]

Direct Link	http://www.ligitek.com

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The purpose of this test is the resistance

of the device under tropical for hours.

High Temperature

High Humidity Test

1.Ta=65

℃±5℃

2.RH=90%~95%

3.t=240hrs

±2hrs

MIL-STD-202:103B

JIS C 7021: B-11

MIL-STD-202: 208D

MIL-STD-750: 2026

MIL-STD-883: 2003

JIS C 7021: A-2

1.T.Sol=230

℃±5℃

2.Dwell time=5

±1sec

Solderability Test

This test intended to see soldering well

performed or not.

MIL-STD-202: 107D

MIL-STD-750: 1051

MIL-STD-883: 1011

MIL-STD-202: 210A

MIL-STD-750: 2031

JIS C 7021: A-1

1.T.Sol=260

℃±5℃

2.Dwell time= 10

±1sec.

Solder Resistance

Test

This test intended to determine the

thermal characteristic resistance

of the device to sudden exposures

at extreme changes in temperature

when soldering the lead wire.

1.Ta=105

℃±5℃&-40℃±5℃

(10min) (10min)

2.total 10 cycles

Thermal Shock Test

The purpose of this is the resistance of

the device to sudden extreme changes

in high and low temperature.

Reliability Test:

JIS C 7021: B-12

MIL-STD-883:1008

JIS C 7021: B-10

The purpose of this is the resistance

of the device which is laid under

condition of low temperature for hours.

1.Ta=-40

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

Low Temperature

Storage Test

1.Ta=105

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

High Temperature

Storage Test

The purpose of this is the resistance of

the device which is laid under condition

of high temperature for hours.

MIL-STD-750: 1026

MIL-STD-883: 1005

JIS C 7021: B-1

Reference

Standard

1.Under Room Temperature

2.If=10mA

3.t=1000 hrs (-24hrs, +72hrs)

Test Condition

Operating Life Test

Test Item

This test is conducted for the purpose

of detemining the resistance of a part

in electrical and themal stressed.

Description

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

PART NO. LDD525/64-XX-PF

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