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LTC2171CUKG-14TRPBF Datasheet(PDF) 7 Page - Linear Technology |
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LTC2171CUKG-14TRPBF Datasheet(HTML) 7 Page - Linear Technology |
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7 / 32 page  LTC2172-14/ LTC2171-14/LTC2170-14 7 21721014f SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS Digital Data Outputs (RTERM = 100Ω Differential, CL = 2pF to GND on Each Output) tSER Serial Data Bit Period 2-Lanes, 16-Bit Serialization 2-Lanes, 14-Bit Serialization 2-Lanes, 12-Bit Serialization 1-Lane, 16-Bit Serialization 1-Lane, 14-Bit Serialization 1-Lane, 12-Bit Serialization 1 / (8 • fS) 1 / (7 • fS) 1 / (6 • fS) 1 / (16 • fS) 1 / (14 • fS) 1 / (12 • fS) s s s s s s tFRAME FR to DCO Delay (Note 8) l 0.35 • tSER 0.5 • tSER 0.65 • tSER s tDATA DATA to DCO Delay (Note 8) l 0.35 • tSER 0.5 • tSER 0.65 • tSER s tPD Propagation Delay (Note 8) l 0.7n + 2 • tSER 1.1n + 2 • tSER 1.5n + 2 • tSER s tR Output Rise Time Data, DCO, FR, 20% to 80% 0.17 ns tF Output Fall Time Data, DCO, FR, 20% to 80% 0.17 ns DCO Cycle-to-Cycle Jitter tSER = 1ns 60 psP-P Pipeline Latency 6 Cycles SPI Port Timing (Note 8) tSCK SCK Period Write Mode Readback Mode, CSDO = 20pF, RPULLUP = 2k l l 40 250 ns ns tS CS to SCK Set-Up Time l 5ns tH SCK to CS Set-Up Time l 5ns tDS SDI Set-Up Time l 5ns tDH SDI Hold Time l 5ns tDO SCK Falling to SDO Valid Readback Mode CSDO = 20pF, RPULLUP = 2k l 125 ns Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: All voltage values are with respect to GND with GND and OGND shorted (unless otherwise noted). Note 3: When these pin voltages are taken below GND or above VDD, they will be clamped by internal diodes. This product can handle input currents of greater than 100mA below GND or above VDD without latchup. Note 4: When these pin voltages are taken below GND they will be clamped by internal diodes. When these pin voltages are taken above VDD they will not be clamped by internal diodes. This product can handle input currents of greater than 100mA below GND without latchup. Note 5: VDD = OVDD = 1.8V, fSAMPLE = 65MHz (LTC2172), 40MHz (LTC2171), or 25MHz (LTC2170), 2-lane output mode, differential ENC+/ENC– = 2VP-P sine wave, input range = 2VP-P with differential drive, unless otherwise noted. Note 6: Integral nonlinearity is defined as the deviation of a code from a best fit straight line to the transfer curve. The deviation is measured from the center of the quantization band. Note 7: Offset error is the offset voltage measured from –0.5 LSB when the output code flickers between 00 0000 0000 0000 and 11 1111 1111 1111 in 2’s complement output mode. Note 8: Guaranteed by design, not subject to test. Note 9: VDD = OVDD = 1.8V, fSAMPLE = 65MHz (LTC2172), 40MHz (LTC2171), or 25MHz (LTC2170), 2-lane output mode, ENC+ = single- ended 1.8V square wave, ENC– = 0V, input range = 2VP-P with differential drive, unless otherwise noted. The supply current and power dissipation specifications are totals for the entire chip, not per channel. Note 10: Recommended operating conditions. Note 11: The maximum sampling frequency depends on the speed grade of the part and also which serialization mode is used. The maximum serial data rate is 1000Mbps, so tSER must be greater than or equal to 1ns. Note 12: Near-channel crosstalk refers to Ch. 1 to Ch.2, and Ch.3 to Ch.4. Far-channel crosstalk refers to Ch.1 to Ch.3, Ch.1 to Ch.4, Ch.2 to Ch.3, and Ch.2 to Ch.4. TIMING CHARACTERISTICS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 5) |
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