MC10125

MOTOROLA

MECL Data

DL122 — Rev 6

3–92

TEST VOLTAGE VALUES (Volts)

@ Test Temperature

VIHH

VILH

VBB

VCC

VEE

–30

°C –1.890 –2.890

From

+5.0

–5.2

+25

°C –1.810 –2.850

From

Pin

1

+5.0

–5.2

+85

°C –1.700 –2.825

1

+5.0

–5.2

Pin

Under

TEST VOLTAGE APPLIED TO PINS LISTED BELOW

Gd

Output

Characteristic

Symbol

Under

Test

VIHH

VILH

VBB

VCC

VEE

Gnd

Output

Condition

Negative Power Supply

Drain Current

IE

8

3,7,11,15

9

8

16

Positive Power Supply

Di C

t

ICCH

9

3,7,11,15

9

8

16

pp y

Drain Current

ICCL

9

3,7,11,15

9

8

16

Input Current

IinH1

2

3,7,11,15

9

8

16

Input Leakage Current

ICBO

2

3,7,11,15

9

2,6,8,10,14

16

High Output Voltage

VOH

4

3,7,11,15

9

8

16

–2.0mA

Low Output Voltage

VOL

4

3,7,11,15

9

8

16

20mA

High Threshold Voltage

VOHA

4

3,7,11,15

9

8

16

–2.0mA

Low Threshold Voltage

VOLA

4

3,7,11,15

9

8

16

20mA

Indeterminate Input

Protection Tests

VOLS1

4

9

2,3,6,7,8,

10,11,14,15

16

20mA

VOLS2

4

9

8

16

20mA

Short Circuit Current

IOS

4

3,7,11,15

9

8

4, 16

Reference Voltage

VBB

1

3,7,11,15

Common Mode Rejection Tests

VOH

4

4

3

2

9

9

8

8

16

16

–2.0mA

–2.0mA

VOL

4

4

2

3

9

9

8

8

16

16

20mA

20mA

Switching Times

(50

Ω Load)

Propagation Delay

(50% to +1.5Vdc)

t6+5–

t6–5+

t2+4–

t2–4+

5

5

4

4

3,7,11,15

3,7,11,15

3,7,11,15

3,7,11,15

9

9

9

9

8

8

8

8

16

16

16

16

Rise Time

(+1.0V to 2.0V)

t4+

4

3,7,11,15

9

8

16

Fall Time

(+1.0V to 2.0V)

t4–

4

3,7,11,15

9

8

16

1. Individually test each output, apply VIHmax to pin under test.

Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been

established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.

Outputs are terminated through a 50-ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the

same manner.