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3EZ56 Datasheet(PDF) 4 Page - Transys Electronics |
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3EZ56 Datasheet(HTML) 4 Page - Transys Electronics |
4 / 5 page For worst-case design, using expected limits of Iz, limits of PD and the extremes of TJ ( TJL ) may be estimated. Changes in voltage, Vz, can then be found from: V = VZ TJ VZ , the zener voltage temperature coefficient, is found from Figures 5 and 6. Under high power-pulse operation, the zener voltage will vary with time and may also be affected significantly be the zener resistance. For best regulation, keep current excursions as low as possible. Data of Figure 2 should not be used to compute surge capability. Surge limitations are given in Figure 3. They are lower than would be expected by considering only junction temperature, as current crowding effects cause temperatures to be extremely high in small spots resulting in device degradation should the limits of Figure 3 be exceeded. RATING AND CHARACTERISTICS CURVES 3EZ11 THRU 3EZ200 TEMPERATURE COEFFICIENT REAGES (90% of the Units are int he Ranges Indicated) Fig. 5-UNITS TO 12 VOLTS Fig. 6-UNITS 10 TO 200 VOLTS Fig. 7-VZ = 3.9 THRU 10 VOLTS Fig. 8- VZ = 12 THRU 82 VOLTS |
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