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HMP351S6AFR8C-S6 Datasheet(PDF) 9 Page - Hynix Semiconductor

Part # HMP351S6AFR8C-S6
Description  200pin Unbuffered DDR2 SDRAM SO-DIMMs based on 2Gb version A
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Manufacturer  HYNIX [Hynix Semiconductor]
Direct Link  http://www.skhynix.com/kor/main.do
Logo HYNIX - Hynix Semiconductor

HMP351S6AFR8C-S6 Datasheet(HTML) 9 Page - Hynix Semiconductor

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Rev. 1.0 / Dec. 2009
9
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
OUTPUT BUFFER LEVELS
OUTPUT AC TEST CONDITIONS
Notes:
1. The VDDQ of the device under test is referenced.
OUTPUT DC CURRENT DRIVE
Notes:
1. VDDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ)/IOH must be less than 21 ohm for values of VOUT between VDDQ and
VDDQ - 280 mV.
2. VDDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 ohm for values of VOUT between 0 V and 280 mV.
3. The dc value of VREF applied to the receiving device is set to VTT
4. The values of IOH(dc) and IOL(dc) are based on the conditions given in Notes 1 and 2. They are used to test device
drive current capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are delivered to an
SSTL_18 receiver.
The actual current values are derived by shifting the desired driver operating point along a 21 ohm load line to define
a convenient driver current for measurement.
Symbol
Parameter
SSTL_18
Units
Notes
VOTR
Output Timing Measurement Reference Level
0.5 * VDDQ
V1
Symbol
Parameter
SSTl_18
Units
Notes
IOH(dc)
Output Minimum Source DC Current
- 13.4
mA
1, 3, 4
IOL(dc)
Output Minimum Sink DC Current
13.4
mA
2, 3, 4


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