Rev. 0.2 / Mar. 2005

11

512Mb A-ver. DDR2 SDRAM

3. AC & DC Operating Conditons

3.1 DC Operating Conditions

3.1.1 Recommended DC Operating Conditions (SSTL_1.8)

3.1.2 ODT DC electrical characteristics

Symbol

Parameter

Rating

Units

Notes

Min.

Typ.

Max.

VDD

Supply Voltage

1.7

1.8

1.9

V

1

VDDL

Supply Voltage for DLL

1.7

1.8

1.9

V

1,2

VDDQ

Supply Voltage for Output

1.7

1.8

1.9

V

1,2

VREF

Input Reference Voltage

0.49*VDDQ

0.50*VDDQ

0.51*VDDQ

mV

3,4

VTT

Termination Voltage

VREF-0.04

VREF

VREF+0.04

V

5

1. Min. Typ. and Max. values increase by 100mV for C3(DDR2-533 3-3-3) speed option.

2. VDDQ tracks with VDD,VDDL tracks with VDD. AC parameters are measured with VDD,VDDQ and VDD.

3. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the value of VREF is

expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ

4. Peak to peak ac noise on VREF may not exceed +/-2% VREF (dc).

5. VTT of transmitting device must track VREF of receiving device.

PARAMETER/CONDITION

SYMBOL

MIN

NOM

MAX

UNITS

NOTES

Rtt effective impedance value for EMRS(A6,A2)=0,1; 75 ohm

Rtt1(eff)

60

75

90

ohm

1

Rtt effective impedance value for EMRS(A6,A2)=1,0; 150 ohm

Rtt2(eff)

120

150

180

ohm

1

Rtt effective impedance value for EMRS(A6,A2)=1,1; 50 ohm

Rtt3(eff)

40

50

60

ohm

1,2

Deviation of VM with respect to VDDQ/2

delta VM

-6

+6

%

1

Note

1. Test condition for Rtt measurements

2. Optional for DDR2-400/533/667/800

Measurement Definition for VM : Measurement Voltage at test pin(mid point) with no load.

Rtt(eff) =

V

delta VM =

2 x Vm

VDDQ

x 100%

- 1