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74HC00BQ Datasheet(PDF) 7 Page - NXP Semiconductors

Part No. 74HC00BQ
Description  Quad 2-input NAND gate
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Maker  NXP [NXP Semiconductors]
Homepage  http://www.nxp.com
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 7 page
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74HC_HCT00_4
© NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 04 — 11 January 2010
7 of 15
NXP Semiconductors
74HC00; 74HCT00
Quad 2-input NAND gate
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Fig 7.
Load circuitry for measuring switching times
001aah768
tW
tW
tr
tr
tf
VM
VI
negative
pulse
GND
VI
positive
pulse
GND
10 %
90 %
90 %
10 %
VM
VM
VM
tf
VCC
DUT
RT
VI
VO
CL
G
Table 9.
Test data
Type
Input
Load
Test
VI
tr, tf
CL
74HC00
VCC
6.0 ns
15 pF, 50 pF
tPLH, tPHL
74HCT00
3.0 V
6.0 ns
15 pF, 50 pF
tPLH, tPHL




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