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74HC2G34 Datasheet(PDF) 9 Page - NXP Semiconductors |
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74HC2G34 Datasheet(HTML) 9 Page - NXP Semiconductors |
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9 / 14 page  74HC_HCT2G34_1 © NXP B.V. 2006. All rights reserved. Product data sheet Rev. 01 — 6 October 2006 9 of 14 NXP Semiconductors 74HC2G34; 74HCT2G34 Dual buffer gate Test data is given in Table 11. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. Fig 6. Load circuitry for switching times mgk563 D.U.T VCC VCC VI VO RT RL = 1 kΩ CL 50 pF open PULSE GENERATOR Table 11. Test data Type Input Test VI tr, tf tPHL, tPLH 74HC2G34 GND to VCC 6 ns open 74HCT2G34 GND to 3.0 V 6 ns open |
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